Method for identifying stress waves introduced in defect-induced laser damage dynamic behavior

The invention provides a method for identifying stress waves introduced in defect-induced laser damage dynamic behaviors, and belongs to the technical field of engineering optics. The problems that when mechanical response of KDP crystals in the laser damage process is explored in the prior art, mut...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN GUANG, DING WENYU, LIU ZHICHAO, XU QIAO, LEI HONGQIN, WANG SHENGFEI, ZHAO LINJIE, HU JIANRUI, CHENG JIAN, CHEN MINGJUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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