Method for identifying stress waves introduced in defect-induced laser damage dynamic behavior
The invention provides a method for identifying stress waves introduced in defect-induced laser damage dynamic behaviors, and belongs to the technical field of engineering optics. The problems that when mechanical response of KDP crystals in the laser damage process is explored in the prior art, mut...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a method for identifying stress waves introduced in defect-induced laser damage dynamic behaviors, and belongs to the technical field of engineering optics. The problems that when mechanical response of KDP crystals in the laser damage process is explored in the prior art, mutual influence among multiple stress waves is not considered, and it is difficult to associate the stress waves with damage are solved. Based on a damage dynamics finite element method model, four stress waves generated through induction under laser irradiation are determined, a characteristic equation of wave velocities of longitudinal waves and head waves in the KDP crystal material is established, expressions of wave velocities of shear waves and Rayleigh waves are combined, and the wave velocities of the shear waves and the Rayleigh waves are solved. According to the method, the stress waves can be accurately identified, the influence mechanism and degree of the stress waves with different forms and different ch |
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