Lamp durability test device and test method

The invention provides a lamp durability test device and method, and the device comprises a test equipment bottom plate, one end of the upper side of the test equipment bottom plate is provided with a test support frame, the middle part of the upper side of the test equipment bottom plate is provide...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	TONG ZUDE, CHEN CHANGNAN, HUANG BIN, DONG QIANGLONG, SHI RUIHUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	The invention provides a lamp durability test device and method, and the device comprises a test equipment bottom plate, one end of the upper side of the test equipment bottom plate is provided with a test support frame, the middle part of the upper side of the test equipment bottom plate is provided with a lamp test support, and the test support frame at one side of the lamp test support is provided with a lamp connection contact. A light filtering device is arranged on the test supporting frame on the upper side of the lamp test support, a light detection device is arranged on the test supporting frame on the upper side of the light filtering device, the lamp test support comprises a lamp placing plate, and a detection fixing groove is formed in the lamp placing plate. A lamp fixing plate is arranged on the portion, on one side of the detection fixing groove, of the lamp containing plate, the middle of the lamp fixing plate is rotationally installed on the lamp containing plate, and a connection driving air