Three-dimensional model deformation method and device based on two-dimensional image feature guidance

The invention discloses a three-dimensional model deformation method and device based on two-dimensional image feature guidance, and the method comprises the steps: inputting a target picture into a preset dual-model network, recognizing boundary points and two end points of the target picture, and...

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Bibliographische Detailangaben
Hauptverfasser: ZHENG ZHUYIN, XIAO DONGDONG, HUANG QIONG, GAO YUEFANG, LI BIZHENG, YANG FENG, YANG CUNYI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a three-dimensional model deformation method and device based on two-dimensional image feature guidance, and the method comprises the steps: inputting a target picture into a preset dual-model network, recognizing boundary points and two end points of the target picture, and obtaining a three-dimensional model which is most similar to the target picture from a three-dimensional model library through employing a similarity measurement method; obtaining a boundary point and two end points of the most similar three-dimensional model, and performing projection in the maximum principal direction to obtain a two-dimensional boundary point and two end points of the two-dimensional grid model; mapping boundary points of the two-dimensional grid model to the boundary of the target picture to obtain a two-dimensional target boundary; then, Z-value coordinates of the three-dimensional model are added to the two-dimensional target boundary, and a three-dimensional target boundary is obtained; and