CIS chip test method and test system

The invention discloses a CIS chip test method and test system, the test method is applied to the CIS chip test system, the CIS chip test system comprises a central control unit and a test unit, and the method comprises the following steps: after a to-be-tested CIS chip is added into a test platform, the central control unit generates a test task about the to-be-tested CIS chip, and indicates the test unit to execute the test task; the test unit analyzes whether the same test item exists in the test task, and if the same test item exists in the test task, the CIS chips to be tested are sorted according to a first-in first-out sequence; according to the chip sorting result, the test parameters in the test tasks, the equipment state and the running state of the test platform, star-chain task allocation is carried out on the test tasks, different test tasks are executed in parallel, and the same test tasks are executed in series according to the chip sorting result; and the test unit feeds back a test task compl