Contactor and socket apparatus for pre-firing and testing semiconductor devices

The present invention relates to a contactor and a socket apparatus for pre-firing and testing a semiconductor device, the contactor comprising: an upper terminal portion (111) having an upper tip portion (111b) at an upper end portion; a lower terminal part (112) which has a lower tip part (112c) located at the lower end, and which is provided on the same axis as the upper terminal part (111); and an elastic portion (113) for elastically supporting the upper terminal portion (111) and the lower terminal portion (112), the contactor being made of a strip-shaped plate (tlt; the terminal includes an upper terminal portion (111) and a lower terminal portion (112) each including shoulder portions (111a, 112a) protruding in a width direction thereof, and an elastic portion (113) having a third width (w3) larger than a first width (w1) of the upper terminal portion (111) and a second width (w2) (w1, w2lt; the elastic part (113) is composed of a first strip (113a) and a second strip (113b) which are formed perpendic