Electric leakage test circuit of TBU device under high voltage

The invention discloses an electric leakage test circuit of a TBU device under high voltage, and belongs to the technical field of electric leakage testing, the electric leakage test circuit comprises a first power supply, a second power supply, a first capacitor, a first switch tube and a second sw...

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Bibliographische Detailangaben
Hauptverfasser: XU XU, ZHAO GUOQING, GE JUNJI, LIANG YUANYUAN, XIA BING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an electric leakage test circuit of a TBU device under high voltage, and belongs to the technical field of electric leakage testing, the electric leakage test circuit comprises a first power supply, a second power supply, a first capacitor, a first switch tube and a second switch tube, the positive electrode of the first power supply is connected with the positive electrode of the first switch tube, and the negative electrode of the first switch tube is connected with the first end of the TBU device; the positive electrode of the second power supply is connected with the first end of the TBU device, the negative electrode of the first power supply is grounded, the second end of the TBU device is grounded, the negative electrode of the second power supply is grounded, the first capacitor is connected to the two ends of the first power supply in parallel, and the gate electrode of the first switch tube is connected with the collector electrode of the second switch tube. The collector ele