High-speed dynamic process DIC measuring device and method based on time domain super-resolution

The invention relates to a high-speed dynamic process DIC measuring device and method based on time domain super-resolution, and the device comprises a high-speed image collection hardware system which is mainly composed of a DMD, an imaging sensor, a TIR prism, a lens group 1, a lens group 2, and a control processing module. The high-speed dynamic process DIC measurement method further comprises a time domain super-resolution reconstruction algorithm and DIC strain measurement, integrates the functions of high-speed image acquisition, reconstruction and DIC strain measurement, and has the advantages that the high-speed image acquisition, reconstruction and DIC strain measurement are realized under the condition that the single-frame imaging resolution of the camera is not reduced; high spatial resolution and high frame rate image acquisition and corresponding image DIC strain measurement in a high-speed dynamic process are realized, and the method has the advantages of high spatial-temporal resolution, high