Test system and test method

The invention provides a test system. The test system comprises a plurality of memory circuits and a test circuit. The test circuit is coupled to the memory circuits. The test circuit is used for executing a read-write operation on the memory circuits, and each memory circuit is provided with a read-write starting time point corresponding to the read-write operation. The test circuit is also used for controlling the read-write start time points of the memory circuits to be different from each other. 本发明提供一种测试系统，其包括多个存储器电路以及一测试电路。测试电路耦接这些存储器电路。测试电路用于对这些存储器电路执行一读写操作，且这些存储器电路各自具有对应于读写操作的一读写起始时间点。测试电路还用于控制这些存储器电路的这些读写起始时间点为彼此相异。