On-chip unequal-width spiral inductor determination method and device based on data fitting
The embodiment of the invention provides an on-chip non-equal-width spiral inductor determination method and device based on data fitting, and the method comprises the steps: enabling any n circles of on-chip polygonal non-equal-width spiral inductors to be equivalent to regular polygonal non-equal-...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides an on-chip non-equal-width spiral inductor determination method and device based on data fitting, and the method comprises the steps: enabling any n circles of on-chip polygonal non-equal-width spiral inductors to be equivalent to regular polygonal non-equal-width concentric closed metal with the same number of circles, fitting parameters for inductance calculation are determined according to the equivalent regular polygon non-equal-width concentric closed metal, and the fitting parameters comprise the number of turns, the average diameter, the metal filling factor and the thickness factor of the regular polygon non-equal-width concentric closed metal; determining a fitting coefficient of inductance calculation according to a random inductance layout simulation result of the electromagnetic simulator; constructing a fitting inductance calculation formula according to the fitting parameter, the fitting coefficient and the insulating medium magnetic conductivity constant |
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