Method for verifying reliability of semiconductor laser chip

The invention relates to the technical field of semiconductor laser chip aging test, and discloses a semiconductor laser chip reliability verification method comprising the following steps: carrying out series connection test on a pulse driving circuit and a preset number of semiconductor laser chip...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG YONG, ZHAO SANGZHI, ZHOU DELAI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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