Temperature control test method
The invention discloses a temperature control test method which comprises the following steps: S100, detecting the actual temperature Ak of a kth test module, and when Ak and the required test temperature Bk of the test module meet the condition that Ak is less than Bk, controlling a kth heat exchan...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a temperature control test method which comprises the following steps: S100, detecting the actual temperature Ak of a kth test module, and when Ak and the required test temperature Bk of the test module meet the condition that Ak is less than Bk, controlling a kth heat exchange device to transfer heat from a kth second circulation module to the kth test module; s200, Ak is detected, when Ak is larger than Bk, the first circulation module and the kth second circulation module are started, meanwhile, the kth heat exchange device is controlled, and heat is transmitted to the kth second circulation module from the kth test module; by applying the method, the space occupation of the temperature control system can be reduced while the working temperature of each test module can be accurately controlled.
本发明公开了一种温控测试方法,包括如下步骤:S100、检测第k个测试模块的实际温度Ak,当Ak与该测试模块的要求测试温度Bk满足Ak<Bk时,控制第k个热交换装置,将热量从第k个第二循环模组传递给第k个测试模块;S200、检测Ak,当Ak>Bk时,开启第一循环模组和第k个第二循环模组,同时控制第k个热交换装置,将热量从第k个测试模块传递给第k个第二循环模组;应用上述方法能够精准控 |
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