High-sensitivity thermometer based on silicon carbide double-vacancy color center and measuring method

The invention discloses a high-sensitivity thermometer based on a silicon carbide double-vacancy color center and a measuring method. The device mainly comprises a first three-dimensional precise sample stage, a second three-dimensional precise sample stage, a microscope objective, a cage-type struc...

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Bibliographische Detailangaben
Hauptverfasser: WANG JUNFENG, LUO QINYUE
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a high-sensitivity thermometer based on a silicon carbide double-vacancy color center and a measuring method. The device mainly comprises a first three-dimensional precise sample stage, a second three-dimensional precise sample stage, a microscope objective, a cage-type structured optical machine assembly, a laser, a multimode optical fiber, a dichroscope, an optical filter, an imaging CCD, an electromagnet, a microwave source, a photoelectric detector, a Lock-in phase-locked amplification system, a beam combiner, a pulse card, a computer and the like. The microscope optical system adopts a stable and easy-to-build cage type system, is formed by assembling cage type structure optical machine components, and is used for exciting a sample and efficiently collecting fluorescence; the pulse card and the computer system are used for coherent control of the color center of the sample; the multimode fiber is used for spatial filtering; and the photoelectric detector realizes fluorescence dete