Calibration method for on-chip large-scale optical switch array of Benes architecture

The invention provides a calibration method for an on-chip large-scale optical switch array of a Benes framework. The calibration method comprises the following steps: firstly, selecting a target path; then, a crosstalk path is judged, and the influence caused by the crosstalk path is reduced to the...

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Hauptverfasser: ZENG GUOYAN, YIN YUEXIN, ZHANG DAMING, LU XINYU, XU XINRU, OUYANG AOQI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a calibration method for an on-chip large-scale optical switch array of a Benes framework. The calibration method comprises the following steps: firstly, selecting a target path; then, a crosstalk path is judged, and the influence caused by the crosstalk path is reduced to the minimum; scanning the voltage of a next-stage target switch passed by the target path, finding out the voltage which enables the output end to detect the strongest light intensity, and maintaining the voltage at the voltage; maintaining switch states required by paths of all pre-stage switches on the target path, and scanning the target switch at the stage to obtain a result; and finally, light path connection is replaced, and related steps are repeated to complete calibration of all switches. According to the method, the test result is accurate and reliable, the working performance of the on-chip large-scale optical switch array of the Benes architecture is integrally improved, the working state is more stable, t