Abnormity monitoring method and device for grain depot door and medium

The invention discloses an abnormity monitoring method and device for a grain depot bin gate and a medium, and the method comprises the steps: carrying out the image collection through an image collection device, so as to obtain a bin gate image containing the grain depot bin gate; performing image...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHAO CHUNYUN, ZHAO YUNKE, ZHANG ZHUANG, ZHANG XINGZHEN, WANG HONGDA, JIA TENGFEI, CHEN CHAO, ZOU ZONGRUI
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses an abnormity monitoring method and device for a grain depot bin gate and a medium, and the method comprises the steps: carrying out the image collection through an image collection device, so as to obtain a bin gate image containing the grain depot bin gate; performing image analysis on the granary door image to obtain an image analysis result for the granary door, the image analysis result being used for accommodating the state of the granary door; obtaining operation rule information corresponding to the grain depot door; and determining that the grain depot door is in an abnormal state according to an image analysis result, determining that the abnormal state does not accord with operation rule information, and giving an alarm. When the granary door image is analyzed, not only the current state of the granary door of the grain depot is considered, but also whether the state accords with a corresponding operation rule is considered. Only in the abnormal state which does not accord wi