Plate thickness measurement system capable of automatically switching measurement modes

The invention discloses a plate thickness measurement system capable of automatically switching measurement modes, which comprises a measurement device and a control system, and is characterized in that the control system is connected with the measurement device, and the control system is used for c...

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Bibliographische Detailangaben
Hauptverfasser: YANG MU, CAO JINGZHONG, YANG HUIHUA
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a plate thickness measurement system capable of automatically switching measurement modes, which comprises a measurement device and a control system, and is characterized in that the control system is connected with the measurement device, and the control system is used for controlling the measurement device to measure the thickness of a plate; the measuring device comprises a base, a guide roller passing mechanism, a linear guide rail mechanism and a scanning mechanism, the guide roller passing mechanism is fixedly arranged on the base and is used for supporting a plate to be measured so as to measure the thickness of the plate; the linear guide rail mechanism is fixedly installed on the base and used for driving the scanning mechanism to move back and forth. The scanning mechanism is installed on the linear guide rail mechanism in a sliding mode and used for scanning the to-be-measured plate and achieving measurement of the thickness of the plate. By setting automatic switching of me