Novel electroplated chip appearance defect detection equipment and detection method thereof

The invention relates to the technical field of electroplated chip appearance detection, in particular to novel electroplated chip appearance defect detection equipment and a detection method thereof. The device comprises a device body, and a feeding device, a detecting device, a marking device and a discharging device are sequentially arranged on the device body in the horizontal transverse direction. A discharging track used for conveying the electroplated chip strips is formed on the feeding device in the horizontal transverse direction, a detection track in butt joint with the discharging track is formed on the detection device, and a detection assembly used for conducting appearance defect detection on the electroplated chip strips is arranged on the detection track. Specifically, the electroplated chip strip is in a long strip shape and is made of a hard material; preferably, the discharging track, the detecting track, the marking track and the discharging track which are sequentially arranged in the ho