Bit error rate testing method, computing device and cabinet

The invention provides a bit error rate testing method, computing equipment and a cabinet. The method is applied to a first computing device in a plurality of computing devices, a plurality of network cards of the plurality of computing devices are connected with a plurality of first high-speed cabl...

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1. Verfasser: LYU YUXUAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a bit error rate testing method, computing equipment and a cabinet. The method is applied to a first computing device in a plurality of computing devices, a plurality of network cards of the plurality of computing devices are connected with a plurality of first high-speed cables of a backboard in a one-to-one correspondence mode, and the plurality of first high-speed cables are connected with a network device. Comprising the following steps: acquiring a first test signal processed by a first network card; the first test signal is acquired by a second computing device in the plurality of computing devices, transmitted to the first network device through a second network card of the second computing device and a first high-speed cable connected with the second network card and forwarded to the first high-speed cable connected with the first network card, and the first network card and the second network card are configured as a test pair; acquiring a second test signal which is the same a