Knowledge graph dynamic updating method
The invention relates to a method for dynamically updating a knowledge graph. The method comprises the following steps: acquiring a first static knowledge graph in the semiconductor field; constructing a dynamic knowledge graph based on business data obtained by performing defect detection on a cert...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a method for dynamically updating a knowledge graph. The method comprises the following steps: acquiring a first static knowledge graph in the semiconductor field; constructing a dynamic knowledge graph based on business data obtained by performing defect detection on a certain batch of wafers after the first static knowledge graph is formed; performing knowledge reasoning on the dynamic knowledge graph to obtain a plurality of initial conclusions related to defect detection; sending the plurality of initial conclusions to a knowledge confirmation platform to obtain a plurality of confirmed knowledge points; and updating the first static knowledge graph by using the plurality of knowledge points to obtain a second static knowledge graph.
本发明涉及一种知识图谱动态更新的方法,包括:获取半导体领域的第一静态知识图谱;基于在所述第一静态知识图谱形成之后对某批次晶圆进行缺陷检测得到的业务数据,构建动态知识图谱;在所述动态知识图谱上进行知识推理,得到与缺陷检测相关的若干初始结论;将所述若干初始结论发送至知识确认平台,得到经过确认的若干知识点;使用所述若干知识点对所述第一静态知识图谱进行更新,得到第二静态知识图谱。 |
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