Automatic test time prediction method and device and model training method

The invention provides an automatic testing time prediction method and device and a model training method, and relates to the technical field of automatic testing, and the method comprises the steps: obtaining a first parameter of each test case of an automatic testing task, the first parameters com...

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Bibliographische Detailangaben
Hauptverfasser: REN JIAWEI, ZHU YUANRUI, ZHU WANYI, LI DEHENG, REN HUILEI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides an automatic testing time prediction method and device and a model training method, and relates to the technical field of automatic testing, and the method comprises the steps: obtaining a first parameter of each test case of an automatic testing task, the first parameters comprise at least one of a test tool, a test object and test environment configuration and a test script; and inputting the first parameter of each test case into a time prediction model to predict execution time for completing the automatic test task. 本公开提供了一种自动化测试的时间预测方法、装置及模型的训练方法,涉及自动化测试技术领域,所述方法包括:获取自动化测试任务的每个测试用例的第一参数,所述第一参数包括测试工具、测试对象和测试环境配置中的至少一个以及测试脚本;将每个测试用例的所述第一参数输入至时间预测模型,以预测完成所述自动化测试任务的执行时间。