Automatic test time prediction method and device and model training method
The invention provides an automatic testing time prediction method and device and a model training method, and relates to the technical field of automatic testing, and the method comprises the steps: obtaining a first parameter of each test case of an automatic testing task, the first parameters com...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an automatic testing time prediction method and device and a model training method, and relates to the technical field of automatic testing, and the method comprises the steps: obtaining a first parameter of each test case of an automatic testing task, the first parameters comprise at least one of a test tool, a test object and test environment configuration and a test script; and inputting the first parameter of each test case into a time prediction model to predict execution time for completing the automatic test task.
本公开提供了一种自动化测试的时间预测方法、装置及模型的训练方法,涉及自动化测试技术领域,所述方法包括:获取自动化测试任务的每个测试用例的第一参数,所述第一参数包括测试工具、测试对象和测试环境配置中的至少一个以及测试脚本;将每个测试用例的所述第一参数输入至时间预测模型,以预测完成所述自动化测试任务的执行时间。 |
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