Device and method for measuring atomic relaxation rate

The invention discloses a device and method for measuring the relaxation rate of atoms, and the device comprises a microwave unit which is used for generating a microwave field which acts on an atomic gas chamber, and enables the atoms in the atomic gas chamber to generate Rabian resonance; the lase...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIN PINGWEI, LIU ZHENG, RU NING, LU BAICHUAN, QU JIFENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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