Device and method for measuring atomic relaxation rate

The invention discloses a device and method for measuring the relaxation rate of atoms, and the device comprises a microwave unit which is used for generating a microwave field which acts on an atomic gas chamber, and enables the atoms in the atomic gas chamber to generate Rabian resonance; the lase...

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Hauptverfasser: LIN PINGWEI, LIU ZHENG, RU NING, LU BAICHUAN, QU JIFENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a device and method for measuring the relaxation rate of atoms, and the device comprises a microwave unit which is used for generating a microwave field which acts on an atomic gas chamber, and enables the atoms in the atomic gas chamber to generate Rabian resonance; the laser unit is used for generating a laser beam to irradiate the atomic gas chamber, and the laser beam is used for detecting the Labir resonance law of atoms; the acquisition unit is used for acquiring the laser beams which are transmitted through the atomic gas chamber and acquiring frequency information of the laser beams; and the upper computer is used for drawing the frequency information of the laser beam into an atomic Radar resonance curve and resolving the atomic Radar resonance curve to obtain the atomic relaxation rate. The device and the method for measuring the atomic relaxation rate, disclosed by the invention, are higher in accuracy. 本发明公开了一种测量原子弛豫率的装置及方法,该装置包括:微波单元,用于产生微波场,作用于原子气室,使原子气室内原子产生拉比共振;激光单元,用于产