Dual-channel dynamic load automatic test system, method, equipment and medium

The invention discloses a dual-channel dynamic load automatic test system, method and device and a medium, a first dynamic test circuit is provided with a first current adjusting module and a second current adjusting module; a connection point of the first current adjusting module and the second current adjusting module is a first detection point; the second dynamic test circuit is provided with a third current adjusting module and a fourth current adjusting module; a connection point of the third current adjusting module and the fourth current adjusting module is a second detection point; the source voltage of the field effect transistor is controlled by adjusting the resistance values of the first dynamic test circuit and the second dynamic test circuit, so that the load current change of the first detection point and the second detection point is controlled. According to the invention, the current flowing to the two chip detection points is different and changes at the same time, the load change of the lar