Parallel test system and parallel test method

The invention discloses a parallel test system and a parallel test method. The parallel test system comprises a test sorting machine, a plurality of test machines, a current relay and a first time relay, the test sorting machine comprises a plurality of clamping mechanisms, the first end of the first clamping mechanism is connected with the first test machine through a test claw, the second end of the first clamping mechanism is connected with the semiconductor device to be tested, and the first test machine is used for executing a first test item on the semiconductor device. According to the scheme, the current relay is used for conducting the common end and the second normally open end after receiving the EOT signal of the first testing machine, so that the second testing machine is connected with the testing sorting machine, and the first clamping mechanism of the testing sorting machine can be connected with the first testing machine and the second testing machine in sequence for testing; according to the