Fixture suitable for multi-direction X-ray inspection of integrated circuit

The invention discloses a clamp suitable for multi-direction X-ray inspection of an integrated circuit, and belongs to the field of reliability tests. The movable tray is divided into the tray base, the transmission shaft, the fixed clamp and the clamp top cover, the integrated circuit is limited in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ZHU GUANZHENG, QI LIXIN, BYUN KANG RAE, CHEN GUANGYAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a clamp suitable for multi-direction X-ray inspection of an integrated circuit, and belongs to the field of reliability tests. The movable tray is divided into the tray base, the transmission shaft, the fixed clamp and the clamp top cover, the integrated circuit is limited in the fixed clamp through the fixed clamp and the clamp top cover, and by means of the rotatable characteristic of the movable tray, the circuit does not need to be taken out after X-ray inspection of the integrated circuit in the Y direction is completed. X-ray inspection in the Z direction can be completed only by rotating the transmission shaft by a certain angle and assembling the transmission shaft with the characteristic hole of the tray base to rotate by 90 degrees. A basic circuit can be prevented from being touched in the direction switching scanning process, the circuit pins are not affected by external force in the clamp, and the problem that according to a traditional material pipe fixing method, the cir