APPARATUS FOR PROCESSING SUBSTRATE
Exemplary embodiments of the present invention provide an apparatus for processing a substrate. The apparatus for processing a substrate includes: a process chamber having a processing space therein; a support unit for supporting the substrate in the processing space; a gas supply unit for supplying...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Exemplary embodiments of the present invention provide an apparatus for processing a substrate. The apparatus for processing a substrate includes: a process chamber having a processing space therein; a support unit for supporting the substrate in the processing space; a gas supply unit for supplying a processing gas to the processing space; and a microwave application unit for applying microwaves to the processing gas to generate plasma, in which the microwave application unit includes a transmission plate disposed above the support unit to radiate microwaves to the processing space; the first waveguide is arranged above the transmission plate; and a first power supply for applying microwaves to the first waveguide, where the first waveguide is disposed in a ring shape.
本发明的示例性实施方案提供了一种用于处理基板的装置。该用于处理基板的装置包括:工艺腔室,在该工艺腔室中具有处理空间;支承单元,该支承单元用于在该处理空间中支承该基板;气体供应单元,该气体供应单元用于将处理气体供应到该处理空间;以及微波施用单元,该微波施用单元用于将微波施用到该处理气体以产生等离子体,其中,该微波施用单元包括传输板,该传输板设置在该支承单元的上方以将微波辐射到该处理空间;第一波导,该第一波导设置在该传输板的上方;以及第一功率供应器,该第一功率供应器用于将微波施用到该第 |
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