Wheat phenological period and yield prediction method and system based on climate change

The invention discloses a wheat phenological period and yield prediction method and system based on climate change, and relates to the technical field of agriculture, and the method comprises the steps: obtaining phenological period data, yield data, yield constituent factor data and climate data of...

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Hauptverfasser: YAN YINGCUN, GAO GUISHENG, ZHAO MENGFAN, LI HONGMEI, LI FAN, YU DI, HE SHENGLU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a wheat phenological period and yield prediction method and system based on climate change, and relates to the technical field of agriculture, and the method comprises the steps: obtaining phenological period data, yield data, yield constituent factor data and climate data of a to-be-predicted region; performing statistical calculation on the phenological period data, the yield data and the yield constituent factor data to obtain phenological period index data and yield index data, and further performing drift diameter analysis to obtain phenological period climate parameters and yield climate parameters; stepwise regression is carried out to obtain a phenological period prediction model and a yield prediction model; based on the climate data, combining initial climate prediction data corresponding to the plurality of climate prediction models to obtain climate prediction data of the to-be-predicted region; and obtaining a phenological period prediction result and a yield prediction re