Rapid measuring device for duplex guide vane and measuring method thereof

The invention provides a rapid measuring device for duplex guide blades and a measuring method thereof, and belongs to the technical field of guide blade measurement and rapid polishing and repairing. The problem that a plurality of detection areas and a plurality of complex curved surfaces cannot b...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	WANG LEI, JIANG XIAO, YAN FUBIN, WU DONGHUI, WU BAOLIN, LIU ZHENJUN, ZHANG YANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The invention provides a rapid measuring device for duplex guide blades and a measuring method thereof, and belongs to the technical field of guide blade measurement and rapid polishing and repairing. The problem that a plurality of detection areas and a plurality of complex curved surfaces cannot be accurately measured at one time by adopting a ruler detection tool in a common ruler detection mode is solved. The large margin plate left side measuring block and the large margin plate right side measuring block are installed on the two sides of one end of the bottom plate respectively, and the large margin plate top radian measuring sample plate and the large margin plate bottom radian measuring sample plate are installed on the tops and the bottoms of the large margin plate left side measuring block and the large margin plate right side measuring block respectively. The small margin plate left side measuring block and the small margin plate right side measuring block are installed on the two sides of the othe