Discharge tube reliability test circuit, device and method
The invention discloses a discharge tube reliability test circuit, device and method, and the test circuit comprises a power supply, a boost voltage regulation circuit, a rectification circuit, a time control circuit, one or more test loops and an upper computer, the boost voltage regulation circuit...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a discharge tube reliability test circuit, device and method, and the test circuit comprises a power supply, a boost voltage regulation circuit, a rectification circuit, a time control circuit, one or more test loops and an upper computer, the boost voltage regulation circuit is connected with the rectification circuit, the rectification circuit is connected with the time control circuit, the time control circuit is connected with one or more test loops, and the one or more test loops are all connected with the upper computer. The time control circuit is used for controlling the gap time of the tested devices in one or more test loops in the continuous test process; and the upper computer is used for acquiring the conduction times and the insulation states of the tested devices in the one or more test loops, and carrying out reliability evaluation on the tested devices. According to the test circuit, the reliability of the tested device can be evaluated by acquiring the accumulated con |
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