Method, system and device for measuring dark current of charge-coupled device

The invention discloses a dark current measurement method, system and device for a charge-coupled device. The method comprises the following steps: controlling the charge-coupled device to work in a full-frame transfer mode and acquiring an image; processing the acquired image, and extracting a char...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WU SHILIN, YAO XIN, YUN JUN, HE DA, YI XUEDONG, ZHANG JIANHUA
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a dark current measurement method, system and device for a charge-coupled device. The method comprises the following steps: controlling the charge-coupled device to work in a full-frame transfer mode and acquiring an image; processing the acquired image, and extracting a charge-voltage conversion factor in the image and a dark signal response rate under integral time; and calculating the dark current of the charge-coupled device according to the charge-voltage conversion factor and the dark signal response rate under the integral time. Compared with the prior art, the dark signal response rates under multiple different integration times can be obtained by randomly collecting one frame of image, the dark current can be quickly and accurately calculated, the test efficiency and the test accuracy are greatly improved, and the method can be well applied to scientific application occasions. 本发明公开了一种电荷耦合器件的暗电流测量方法、系统及装置,包括控制电荷耦合器件工作于全帧转移模式并采集图像;对采集的图像进行处理,提取所述图像中的电荷-电压转换因子和积分时间下的暗信号响应率;根据所述电