Thin-layer structure high-resolution seismic characterization method and device

The invention provides a thin-layer structure high-resolution seismic characterization method and device, and relates to the technical field of oil-gas exploration, and the method specifically comprises the following steps: obtaining seismic data S to obtain a seismic wavelet w (t), obtaining a logging reflection coefficient sequence xi (t) to obtain a logging reflection coefficient subsegment xi (t), and generating a logging reflection coefficient dictionary matrix F; constructing a seismic inversion objective function based on the logging reflection coefficient dictionary matrix F, the seismic data S and the seismic data S, and solving the seismic inversion objective function by using a nonlinear staggered iteration method to obtain a reflection coefficient vector R; and obtaining expected seismic wavelets, and performing convolution operation based on the expected seismic wavelets and the reflection coefficient vector R to obtain thin-layer structure characterization seismic data G. According to the method