Appearance defect detection system and method

The invention relates to the technical field of electronic product appearance defect detection, in particular to an appearance defect detection system and method. The invention also provides an apparent defect detection system which is carried out on the basis of the apparent defect detection equipm...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YANG JEONG-NAM, WANG MENGZHE, LAI MIANLI, LI ENQUAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the technical field of electronic product appearance defect detection, in particular to an appearance defect detection system and method. The invention also provides an apparent defect detection system which is carried out on the basis of the apparent defect detection equipment and is suitable for the apparent defect detection method. The appearance defect detection equipment comprises an equipment body, the equipment body comprises a feeding end and a discharging end, and a feeding system, a dust removal system, a CG surface array detection system, a 2D and 3D combined CG surface detection system, a microspur detection system, a 2D and 3D combined BG surface detection system and a BG surface array detection system are sequentially arranged from the feeding end to the discharging end. Compared with the prior art, the equipment main body can well cover each area of a detection object through single equipment, and different detection parts are detected by adopting a targeted system, so