Appearance 2D and 3D combined detection method and application

The invention relates to the technical field of electronic product appearance defect detection, in particular to an appearance 2D and 3D combined detection method and application. The invention provides an appearance 2D and 3D combined detection method. The method comprises the following steps of 1,...

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Bibliographische Detailangaben
Hauptverfasser: YANG JEONG-NAM, WANG MENGZHE, LAI MIANLI, LI ENQUAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the technical field of electronic product appearance defect detection, in particular to an appearance 2D and 3D combined detection method and application. The invention provides an appearance 2D and 3D combined detection method. The method comprises the following steps of 1, 2D and 3D combined detection feeding, 2, 2D and 3D combined detection discharging, 3, 2D and 3D combined detection material taking, 4, 2D detection, 5, 3D detection and 6, 2D and 3D combined detection discharging. According to the 2D and 3D combined detection method, 2D detection and 3D detection can be well completed in sequence through a single combined detection conveying path, so that appearance defects possibly appearing at a detection object can be well subjected to image collection and recognition, the coverage range is wide, the accuracy of a detection result can be well ensured, and the detection efficiency is improved. Therefore, the product with the appearance defect can be better obtained through detec