Method and system for testing room temperature response parameters of infrared detector
The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution...
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creator | WANG PING SHEN MANLING ZHANG LEI YANG PENGLING WU JUNJIE WANG DAHUI XIE XIANCHEN XUE TIANYANG |
description | The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116295870A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116295870A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116295870A3</originalsourceid><addsrcrecordid>eNqNjDsKAkEQBTcxEPUO7QEEV_EXyqKYaCQYLo3zRhec6aG7Dby9G3gAo0cVxRtWtzP8KYE4B7KPORJFUXKYd_lBKpJ6SAXK_laQwopkAxVWTnCokUTqclRWBAq9urvouBpEfhkmvx1V0-Ph2pxmKNL2H3xHhrfNpa7Xi91qu5nvl_80X7QGOrI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and system for testing room temperature response parameters of infrared detector</title><source>esp@cenet</source><creator>WANG PING ; SHEN MANLING ; ZHANG LEI ; YANG PENGLING ; WU JUNJIE ; WANG DAHUI ; XIE XIANCHEN ; XUE TIANYANG</creator><creatorcontrib>WANG PING ; SHEN MANLING ; ZHANG LEI ; YANG PENGLING ; WU JUNJIE ; WANG DAHUI ; XIE XIANCHEN ; XUE TIANYANG</creatorcontrib><description>The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres</description><language>chi ; eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230623&DB=EPODOC&CC=CN&NR=116295870A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230623&DB=EPODOC&CC=CN&NR=116295870A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG PING</creatorcontrib><creatorcontrib>SHEN MANLING</creatorcontrib><creatorcontrib>ZHANG LEI</creatorcontrib><creatorcontrib>YANG PENGLING</creatorcontrib><creatorcontrib>WU JUNJIE</creatorcontrib><creatorcontrib>WANG DAHUI</creatorcontrib><creatorcontrib>XIE XIANCHEN</creatorcontrib><creatorcontrib>XUE TIANYANG</creatorcontrib><title>Method and system for testing room temperature response parameters of infrared detector</title><description>The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDsKAkEQBTcxEPUO7QEEV_EXyqKYaCQYLo3zRhec6aG7Dby9G3gAo0cVxRtWtzP8KYE4B7KPORJFUXKYd_lBKpJ6SAXK_laQwopkAxVWTnCokUTqclRWBAq9urvouBpEfhkmvx1V0-Ph2pxmKNL2H3xHhrfNpa7Xi91qu5nvl_80X7QGOrI</recordid><startdate>20230623</startdate><enddate>20230623</enddate><creator>WANG PING</creator><creator>SHEN MANLING</creator><creator>ZHANG LEI</creator><creator>YANG PENGLING</creator><creator>WU JUNJIE</creator><creator>WANG DAHUI</creator><creator>XIE XIANCHEN</creator><creator>XUE TIANYANG</creator><scope>EVB</scope></search><sort><creationdate>20230623</creationdate><title>Method and system for testing room temperature response parameters of infrared detector</title><author>WANG PING ; SHEN MANLING ; ZHANG LEI ; YANG PENGLING ; WU JUNJIE ; WANG DAHUI ; XIE XIANCHEN ; XUE TIANYANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116295870A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG PING</creatorcontrib><creatorcontrib>SHEN MANLING</creatorcontrib><creatorcontrib>ZHANG LEI</creatorcontrib><creatorcontrib>YANG PENGLING</creatorcontrib><creatorcontrib>WU JUNJIE</creatorcontrib><creatorcontrib>WANG DAHUI</creatorcontrib><creatorcontrib>XIE XIANCHEN</creatorcontrib><creatorcontrib>XUE TIANYANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG PING</au><au>SHEN MANLING</au><au>ZHANG LEI</au><au>YANG PENGLING</au><au>WU JUNJIE</au><au>WANG DAHUI</au><au>XIE XIANCHEN</au><au>XUE TIANYANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and system for testing room temperature response parameters of infrared detector</title><date>2023-06-23</date><risdate>2023</risdate><abstract>The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres</abstract><oa>free_for_read</oa></addata></record> |
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subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
title | Method and system for testing room temperature response parameters of infrared detector |
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