Method and system for testing room temperature response parameters of infrared detector

The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution...

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Hauptverfasser: WANG PING, SHEN MANLING, ZHANG LEI, YANG PENGLING, WU JUNJIE, WANG DAHUI, XIE XIANCHEN, XUE TIANYANG
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creator WANG PING
SHEN MANLING
ZHANG LEI
YANG PENGLING
WU JUNJIE
WANG DAHUI
XIE XIANCHEN
XUE TIANYANG
description The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres
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subjects COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
title Method and system for testing room temperature response parameters of infrared detector
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