Method and system for testing room temperature response parameters of infrared detector
The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an infrared light detection technology, in particular to a method and a system for testing room temperature response parameters of an infrared detector, and aims to solve the problems that in the prior art, a laser in a middle-infrared band is poor in light spot distribution stability, and a photosensitive surface of a detector is generally smaller than a laser light spot. The test and calibration results of response parameters such as the saturation threshold value of the detector are inaccurate, and the error of the measurement result is large. The method for testing the room temperature response parameters of the infrared detector comprises the following steps: combining an alternating-current optical signal and a direct-current optical signal to form a combined optical signal, controlling the combined optical signal to irradiate a photosensitive surface of a detected detector, extracting an alternating-current electric signal output by the detected detector, and measuring a corres |
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