Deep learning model test method, device and system and storage medium
The invention relates to the field of artificial intelligence, in particular to a deep learning model test method, device and system and a storage medium, and the method comprises the steps that a test party server sends a first mirror image file to a test platform server; the test platform server p...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to the field of artificial intelligence, in particular to a deep learning model test method, device and system and a storage medium, and the method comprises the steps that a test party server sends a first mirror image file to a test platform server; the test platform server pretests the deep learning model based on the first mirror image file, and encapsulates the first mirror image file and the deep learning model into a second mirror image file; performing information abstract calculation on the second mirror image file to obtain a third abstract value; sending the second mirror image file and the third abstract to a test party server; the tester server performs information abstract calculation on the first mirror image file in the second mirror image file to obtain a second abstract value; performing information abstract calculation on the second mirror image file to obtain a fourth abstract value; obtaining a first digest value; and testing the deep learning model in the second mir |
---|