Deep learning model test method, device and system and storage medium

The invention relates to the field of artificial intelligence, in particular to a deep learning model test method, device and system and a storage medium, and the method comprises the steps that a test party server sends a first mirror image file to a test platform server; the test platform server p...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: XUE YUNZHI, WU XIANG, DONG QIAN, WU BIN, DAI FEIFAN, GAO HUI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the field of artificial intelligence, in particular to a deep learning model test method, device and system and a storage medium, and the method comprises the steps that a test party server sends a first mirror image file to a test platform server; the test platform server pretests the deep learning model based on the first mirror image file, and encapsulates the first mirror image file and the deep learning model into a second mirror image file; performing information abstract calculation on the second mirror image file to obtain a third abstract value; sending the second mirror image file and the third abstract to a test party server; the tester server performs information abstract calculation on the first mirror image file in the second mirror image file to obtain a second abstract value; performing information abstract calculation on the second mirror image file to obtain a fourth abstract value; obtaining a first digest value; and testing the deep learning model in the second mir