Multi-parameter monitor testing method and system

The embodiment of the invention discloses a multi-parameter monitor test method and system, the method is applied to the multi-parameter monitor test system comprising a camera, a processing device and a simulator, the camera is arranged in front of a multi-parameter monitor, and the method comprise...

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Bibliographische Detailangaben
Hauptverfasser: KANG JIANGYUN, WANG WENDAN, CHEN QIANQIAN, WU GUOCE, SUO YANYAN, TU HUIMIN, ZHANG XIAOQING, TANG FEI, LU RUIXIANG, CHEN CHENGXIN, YUAN QING, BAO CHUNJIAO, DU JIANGQI, DENG LI, CHEN CHUNFANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention discloses a multi-parameter monitor test method and system, the method is applied to the multi-parameter monitor test system comprising a camera, a processing device and a simulator, the camera is arranged in front of a multi-parameter monitor, and the method comprises the following steps: the simulator generates an analog signal and sends the analog signal to the multi-parameter monitor, sending a trigger signal to a processing device; the processing equipment receives the trigger signal from the simulator, generates an acquisition instruction according to the trigger signal, and sends the acquisition instruction to the camera; the camera receives an acquisition instruction from the processing equipment, acquires a monitoring image according to the acquisition instruction and sends the monitoring image to the processing equipment, and the monitoring image comprises monitoring information displayed on the display screen by the multi-parameter monitor according to the received a