Scattering imaging method with positioning and size measuring functions

The invention discloses a scattering imaging method with positioning and size measuring functions, which is applied to a scattering imaging device with the positioning and size measuring functions, the device comprises a broadband light source, a scattering medium, a diaphragm and an area array dete...

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Hauptverfasser: WANG XIN, SHI JUNHUI, CHEN RUIMIAN, LI CHIYE, LIANG QICHUAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a scattering imaging method with positioning and size measuring functions, which is applied to a scattering imaging device with the positioning and size measuring functions, the device comprises a broadband light source, a scattering medium, a diaphragm and an area array detector which are linearly and coaxially arranged in sequence, and the area array detector is connected with a computer. According to the method, the object-image relation of an imaging system and a light intensity signal distribution rule after a scattering medium is illuminated by wide-spectrum light are utilized, and size measurement and three-dimensional positioning can be carried out while non-intrusive structure recognition is carried out on a hidden object; the system can be applied to speckle autocorrelation imaging experiments, is simple in structure and convenient to operate, and has great application prospects in the aspects of underwater detection, fog-penetrating imaging and the like. 本发明公开了一种具有定位和尺寸测量功能的