Sensitive field optimization method of planar array capacitive sensor and imaging system

The invention relates to a sensitive field optimization method of a planar array capacitive sensor and an imaging system, belongs to the technical field of electrical capacitance tomography, and solves the problems that a sensitive field of the planar array capacitive sensor in the prior art has a s...

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Hauptverfasser: TANG ZENGWU, WEN YINTANG, SUN YURONG, AN DONGYANG, WANG KAI, ZHANG YUYAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a sensitive field optimization method of a planar array capacitive sensor and an imaging system, belongs to the technical field of electrical capacitance tomography, and solves the problems that a sensitive field of the planar array capacitive sensor in the prior art has a soft field effect and is poor in sensitivity distribution uniformity. The method comprises the following steps: performing convolution operation on a to-be-optimized sensitivity matrix of a sensitive field of a target sensor according to a preset convolution kernel and a moving step length to obtain a convolution average value; elements in the sensitivity matrix to be optimized are optimized according to the obtained convolution average value, so that an optimized sensitivity matrix is obtained; wherein the convolution average value is an average value of a plurality of product values obtained by performing para-phase multiplication operation on the convolution kernel and a sub-matrix of the to-be-optimized sensitiv