Split type board card mainboard testing method, device and system

The invention discloses a split type board card mainboard test method, device and system. The method comprises the following steps: testing a plurality of mainboards of a previous group through a first test card group; when the test of the plurality of mainboards in the previous group is completed, performing FW refreshing on the management board cards in the first test card group, and testing the plurality of mainboards in the current group through the second test card group while performing FW refreshing on the first test card group; when testing of the multiple mainboards in the current group is completed, FW refreshing is conducted on the management board cards in the second test card group, and the multiple mainboards in the next group are tested through the first test card group subjected to FW refreshing while FW refreshing is conducted on the second test card group; through the steps, the first test card group and the second test card group are used for testing all the to-be-tested mainboards in turn