Wavelimeter based on microcavity soliton optical frequency comb and method for measuring wavelength of light beam to be measured
The invention provides a wavelength meter based on a microcavity soliton optical frequency comb, which is configured to measure the wavelength of a light beam to be measured, and comprises a forming unit which is configured to form the microcavity soliton optical frequency comb and comprises a light...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a wavelength meter based on a microcavity soliton optical frequency comb, which is configured to measure the wavelength of a light beam to be measured, and comprises a forming unit which is configured to form the microcavity soliton optical frequency comb and comprises a light source branch which is configured to emit a first light beam; an auxiliary branch configured to emit an auxiliary light beam; the micro-cavity is connected with the light source branch and the auxiliary branch, the first light beam and the auxiliary light beam form a micro-cavity soliton optical frequency comb in the micro-cavity, and the forming unit adjusts the repetition frequency of the micro-cavity soliton optical frequency comb by adjusting the auxiliary light beam; the to-be-measured unit is connected with the forming unit and is configured to combine the to-be-measured light beam with the micro-cavity soliton optical frequency comb; and the measuring unit is connected with the to-be-measured unit and is co |
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