Unit unit detection method and device

The invention discloses a Unit unit detection method and device, and belongs to the technical field of industrial detection. The Unit unit detection method comprises the following steps: carrying out global positioning on an IC carrier plate, and determining at least one Unit set; dividing a target Unit set in the at least one Unit set to obtain a plurality of Unit units; under the condition that a target Unit unit in the plurality of Unit units has defects, positioning the target Unit unit, and determining a target position of a to-be-processed area in the target Unit unit; and based on the target position, carrying out laser processing on the target Unit unit. According to the Unit unit detection method, the Unit region can be quickly divided, subsequent detection is facilitated, the convenience and maintainability are high, the region position needing laser processing can be accurately positioned, and the detection precision is improved. 本申请公开了一种Unit单元检测方法和装置，属于工业检测技术领域。所述Unit单元检测方法包括：对IC载板进行全局定位，确定至少一个Uni