Terahertz wave abnormal reflection device and method
The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal su...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | FAN YUANCHENG ZHANG FULI SUN KANGYAO FU QUANHONG YANG RUISHENG CHEN SONGNAN |
description | The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal substrate, each asymmetric high-resistance silicon medium unit comprises a first high-resistance silicon medium block and a second high-resistance silicon medium block, and the first high-resistance silicon medium blocks and the second high-resistance silicon medium blocks are different in size. And the first high-resistance silicon dielectric blocks and the second high-resistance silicon dielectric blocks are periodically and uniformly distributed on the metal substrate. Terahertz wavefront control is efficiently regulated and controlled through simple structural design, and high-efficiency, broadband and large-angle abnormal reflection is achieved.
本发明公开了一种太赫兹波异常反射器件及方法,包括金属衬底和非对称高阻硅介质单元;所述金属衬底上设置有若干非对称高阻硅介质单元,所述非对 |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN116203663A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN116203663A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN116203663A3</originalsourceid><addsrcrecordid>eNrjZDAJSS1KzEgtKqlSKE8sS1VITMrLL8pNzFEoSk3LSU0uyczPU0hJLctMBkrlpSjkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQzMjA2MzM2NHY2LUAABBgSza</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Terahertz wave abnormal reflection device and method</title><source>esp@cenet</source><creator>FAN YUANCHENG ; ZHANG FULI ; SUN KANGYAO ; FU QUANHONG ; YANG RUISHENG ; CHEN SONGNAN</creator><creatorcontrib>FAN YUANCHENG ; ZHANG FULI ; SUN KANGYAO ; FU QUANHONG ; YANG RUISHENG ; CHEN SONGNAN</creatorcontrib><description>The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal substrate, each asymmetric high-resistance silicon medium unit comprises a first high-resistance silicon medium block and a second high-resistance silicon medium block, and the first high-resistance silicon medium blocks and the second high-resistance silicon medium blocks are different in size. And the first high-resistance silicon dielectric blocks and the second high-resistance silicon dielectric blocks are periodically and uniformly distributed on the metal substrate. Terahertz wavefront control is efficiently regulated and controlled through simple structural design, and high-efficiency, broadband and large-angle abnormal reflection is achieved.
本发明公开了一种太赫兹波异常反射器件及方法,包括金属衬底和非对称高阻硅介质单元;所述金属衬底上设置有若干非对称高阻硅介质单元,所述非对</description><language>chi ; eng</language><subject>ANTENNAS, i.e. RADIO AERIALS ; BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230602&DB=EPODOC&CC=CN&NR=116203663A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230602&DB=EPODOC&CC=CN&NR=116203663A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FAN YUANCHENG</creatorcontrib><creatorcontrib>ZHANG FULI</creatorcontrib><creatorcontrib>SUN KANGYAO</creatorcontrib><creatorcontrib>FU QUANHONG</creatorcontrib><creatorcontrib>YANG RUISHENG</creatorcontrib><creatorcontrib>CHEN SONGNAN</creatorcontrib><title>Terahertz wave abnormal reflection device and method</title><description>The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal substrate, each asymmetric high-resistance silicon medium unit comprises a first high-resistance silicon medium block and a second high-resistance silicon medium block, and the first high-resistance silicon medium blocks and the second high-resistance silicon medium blocks are different in size. And the first high-resistance silicon dielectric blocks and the second high-resistance silicon dielectric blocks are periodically and uniformly distributed on the metal substrate. Terahertz wavefront control is efficiently regulated and controlled through simple structural design, and high-efficiency, broadband and large-angle abnormal reflection is achieved.
本发明公开了一种太赫兹波异常反射器件及方法,包括金属衬底和非对称高阻硅介质单元;所述金属衬底上设置有若干非对称高阻硅介质单元,所述非对</description><subject>ANTENNAS, i.e. RADIO AERIALS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAJSS1KzEgtKqlSKE8sS1VITMrLL8pNzFEoSk3LSU0uyczPU0hJLctMBkrlpSjkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQzMjA2MzM2NHY2LUAABBgSza</recordid><startdate>20230602</startdate><enddate>20230602</enddate><creator>FAN YUANCHENG</creator><creator>ZHANG FULI</creator><creator>SUN KANGYAO</creator><creator>FU QUANHONG</creator><creator>YANG RUISHENG</creator><creator>CHEN SONGNAN</creator><scope>EVB</scope></search><sort><creationdate>20230602</creationdate><title>Terahertz wave abnormal reflection device and method</title><author>FAN YUANCHENG ; ZHANG FULI ; SUN KANGYAO ; FU QUANHONG ; YANG RUISHENG ; CHEN SONGNAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN116203663A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>ANTENNAS, i.e. RADIO AERIALS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>FAN YUANCHENG</creatorcontrib><creatorcontrib>ZHANG FULI</creatorcontrib><creatorcontrib>SUN KANGYAO</creatorcontrib><creatorcontrib>FU QUANHONG</creatorcontrib><creatorcontrib>YANG RUISHENG</creatorcontrib><creatorcontrib>CHEN SONGNAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FAN YUANCHENG</au><au>ZHANG FULI</au><au>SUN KANGYAO</au><au>FU QUANHONG</au><au>YANG RUISHENG</au><au>CHEN SONGNAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Terahertz wave abnormal reflection device and method</title><date>2023-06-02</date><risdate>2023</risdate><abstract>The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal substrate, each asymmetric high-resistance silicon medium unit comprises a first high-resistance silicon medium block and a second high-resistance silicon medium block, and the first high-resistance silicon medium blocks and the second high-resistance silicon medium blocks are different in size. And the first high-resistance silicon dielectric blocks and the second high-resistance silicon dielectric blocks are periodically and uniformly distributed on the metal substrate. Terahertz wavefront control is efficiently regulated and controlled through simple structural design, and high-efficiency, broadband and large-angle abnormal reflection is achieved.
本发明公开了一种太赫兹波异常反射器件及方法,包括金属衬底和非对称高阻硅介质单元;所述金属衬底上设置有若干非对称高阻硅介质单元,所述非对</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN116203663A |
source | esp@cenet |
subjects | ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS ELECTRICITY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS |
title | Terahertz wave abnormal reflection device and method |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T14%3A03%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FAN%20YUANCHENG&rft.date=2023-06-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN116203663A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |