Terahertz wave abnormal reflection device and method
The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal su...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a terahertz wave abnormal reflection device and method. The terahertz wave abnormal reflection device comprises a metal substrate and an asymmetric high-resistance silicon medium unit, a plurality of asymmetric high-resistance silicon medium units are arranged on the metal substrate, each asymmetric high-resistance silicon medium unit comprises a first high-resistance silicon medium block and a second high-resistance silicon medium block, and the first high-resistance silicon medium blocks and the second high-resistance silicon medium blocks are different in size. And the first high-resistance silicon dielectric blocks and the second high-resistance silicon dielectric blocks are periodically and uniformly distributed on the metal substrate. Terahertz wavefront control is efficiently regulated and controlled through simple structural design, and high-efficiency, broadband and large-angle abnormal reflection is achieved.
本发明公开了一种太赫兹波异常反射器件及方法,包括金属衬底和非对称高阻硅介质单元;所述金属衬底上设置有若干非对称高阻硅介质单元,所述非对 |
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