Multifunctional semiconductor field effect transistor test circuit and method

The invention discloses a multifunctional semiconductor field effect transistor test circuit and method, and the circuit comprises a dynamic characteristic measurement device which is used for carrying out the control and switching of a test mode of a to-be-tested device; the dynamic characteristic measuring device comprises a control signal output circuit, a multifunctional test circuit and a clamping circuit, and the data acquisition device is used for acquiring electrical parameter data of the to-be-tested device, and the electrical parameter data comprises voltage and current. The semiconductor field effect transistor measuring device can measure the forward conduction characteristic and the reverse conduction characteristic of a semiconductor field effect transistor at the same time, the problems that an existing semiconductor measuring device is single in measuring function and does not have the capacity of measuring the forward characteristic and the reverse characteristic of a device at the same time