Semiconductor device

There is provided a semiconductor device including: a calibration code generator circuit configured to generate a calibration code according to a change in an external condition; a first driver circuit configured to output a data signal having an impedance value controlled by the calibration code; an emphasis control circuit configured to generate an emphasis data signal using the data signal and change the calibration code according to an operation frequency to generate an emphasis code; and a second driver circuit configured to output an emphasis data signal at an impedance value controlled by the emphasis code. 提供了一种半导体装置，该半导体装置包括：校准码生成器电路，其被配置为根据外部条件的变化生成校准码；第一驱动器电路，其被配置为输出具有通过校准码控制的阻抗值的数据信号；加重控制电路，其被配置为利用数据信号生成加重数据信号，并且根据操作频率改变校准码，以生成加重码；和第二驱动器电路，其被配置为以通过加重码控制的阻抗值输出加重数据信号。