Terahertz metal metasurface sensor based on bound state in continuum

The invention discloses a continuum bound state-based terahertz metal metasurface sensor, which is formed by periodically arranging a plurality of square metal metasurface units with the same structure, and is characterized in that each metal metasurface unit comprises a dielectric layer at the bott...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CUI ZIJIAN, CHEN SUGUO, WANG YUE, WANG HAOJIE, ZHANG DACHI, HU HUI, SHI WEI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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