Processor device voltage characterization
Processor device voltage characterization is described. Power reduction and voltage regulation techniques for computing systems and processing devices are presented herein. In one example, a method includes receiving a voltage characterization service through a communication interface of a computing...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Processor device voltage characterization is described. Power reduction and voltage regulation techniques for computing systems and processing devices are presented herein. In one example, a method includes receiving a voltage characterization service through a communication interface of a computing device, the voltage characterization service being communicated by a deployment platform remote from the computing device. The method includes implementing a voltage characterization service for a processing device of the computing apparatus to determine that at least one input voltage of the processing device is below a manufacturer-specified operating voltage, the voltage characterization service including a function test, the functional test applies the processing device at an iteratively adjusted voltage using associated system elements of the computing device in the context. During implementation of the voltage characterization service, the method includes monitoring at least an operational fault of the proce |
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