Elliptic polarization measurement system

An ellipsometry system comprises a constant temperature mechanism, a displacement table, an incidence mechanism, a light receiving mechanism and a detection mechanism. The constant temperature mechanism is suitable for placing a to-be-tested sample and keeping the temperature of the to-be-tested sample in a constant temperature state; a displacement stage configured to be retractable in different directions; the incident mechanism is mounted on the displacement table and is suitable for enabling the first linearly polarized light to be incident to a sample to be detected, so that the first linearly polarized light is reflected on the sample to be detected, and elliptically polarized light is obtained; the light receiving mechanism is mounted on the displacement table and is suitable for converting elliptically polarized light into circularly polarized light; and the detection mechanism is mounted on the displacement table, and is suitable for enabling the focused laser to enter the surface of the sample to be