Rapid calculation method for mass grids of three-dimensional elliptically distributed temperature field
The invention provides a rapid calculation method for mass grids of a three-dimensional elliptically distributed temperature field, which comprises the following steps of: S1, selecting two two-dimensional sections in a three-dimensional grid of a test panel according to the irradiation direction of...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a rapid calculation method for mass grids of a three-dimensional elliptically distributed temperature field, which comprises the following steps of: S1, selecting two two-dimensional sections in a three-dimensional grid of a test panel according to the irradiation direction of a heat source of the temperature field, and performing two-dimensional temperature field numerical simulation on the two-dimensional sections; s2, a series of virtual concentric ellipses are inserted into the three-dimensional grid of the test plate layer by layer in the thickness direction of the test plate to serve as interpolation lines, and values are assigned to the interpolation lines according to the temperature field numerical simulation result of the two-dimensional section; s3, sequentially selecting one point P on one layer of plane in the thickness direction of the test plate, and respectively calculating the shortest distance from the point P to the two adjacent interpolation lines; s4, performing lin |
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